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Scanning Electron Microscope

Photo of JEOL SEM 6310

Imaging and analysis of specimen surfaces.

The JEOL JSM6310 will produce digital images as well as photographic negatives. The microscope is used by a wide variety of researchers from the life science, physical science and engineering departments. A number of accessories are associated with it:

- B.E.I. detector for composition and topography separation.

-Energy-dispersive x-ray detector for chemical analysis.

- Cryogenic stage for studying hydrated specimens.

Decoupled condenser lenses for electron channeling

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