Scanning Electron Microscope
Imaging of specimen surfaces under high &
low vacuum modes.
The JEOL JSM6480LV is a modern scanning electron microscope allowing
easy intuitive operation through the computer. The specimen
chamber is able
to accommodate large samples (up to 20cm) and a motorised stage allows
quick and easy specimen positioning.
A 'Low Vacuum' mode enables samples normally unstable
in a high vacuum, or that have a tendency to 'charge', to be examined.
For example -
pharmaceutical particles, fibres or electronic components may be viewed
without coating. A high sensitivity backscattered electron detector
is fitted for compositional imaging. Digital images
CD. This instrument is suitable for use by
researchers from a variety of disciplines.
sensitivity backscattered detector.