Electron microscopy

To use electron microscopes contact Ursula (U.J.Potter@bath.ac.uk) or John (J.M.Mitchels@bath.ac.uk)

Scanning Electron Microscopy

JEOL SEM6480LV

This microscope allows easy, intuitive operation with a specimen chamber that is able to accommodate large samples and a motorised stage allowing quick and easy specimen positioning. A 'Low Vacuum' mode enables samples normally unstable in a high vacuum, or that have a tendency to 'charge', to be examined. Pharmaceutical particles, fibres or electronic components may be viewed without coating. A high sensitivity backscattered electron detector is fitted for compositional imaging. Features include:

• Low vacuum mode - for charging, uncoated and out-gassing samples.
• Backscattered electron detector for compostional and topographic imaging.
• Oxford INCA X-ray analyser - mapping, line scan, point ID, quantitative analysis.
• Magnifications up to 300,000x (with an ideal sample).
• Large sample chamber (up to 20cm).
• Fully automated stage controls.

JEOL FESEM6301F

This field emission scanning electron microscope allows high resolution imaging. A motorised stage allows quick and easy specimen positioning. A cryo-system is attached for the study of hydrated frozen samples. A high sensitivity backscattered electron detector is fitted for compositional imaging. Features include:

• Oxford ISIS X-ray analyser - mapping, line scan, point ID, low energy analysis using a thin window for elements such as O, C etc.
• Magnifications up to 500,000x (with an ideal sample)
• Cryogenic stage for studying hydrated specimens
• Imaging at low accelerating voltages of 1-5KV
• High sensitivity backscattered detector for compostional and topographic imaging

Transmission Electron Microscope

JEOL JEM1200EXII

This microscope has a maximum operating voltage of 120 kV. It is used by researchers for studies ranging from nanotechnology and the characterization of particles to cell biology, and also for high resolution imaging of thin metal samples with selected-area diffraction. Features include:

• Gatan Dualvision Digital Camera
• Oxford INCA Energy X-Ray Analyser
• ASID for STEM imaging (BEI, TEI, SEI)
• High Contrast Pole Piece
• Magnifications up to 500,000x