We achieve the characterisation of samples through various stylus profiling, optical and electron beam microscopy:

Dektak 6M contact profilometer

Our Dektak 6M contact profilometry system is capable of resolving surface steps with 10 nanometres (nm) accuracy.

Leica optical microscope

Light and dark field imaging down to the micron scale is available on our Leica optical microscope.

Filmetrics reflectometer

The Filmetrics reflectometry system is used for general-purpose film thickness measurements from ~15nm to 70 micrometre (µm).