SU3900 Large chamber Variable pressure scanning electron microscope
This microscope allows easy, intuitive operation, with a specimen chamber that is able to accommodate large samples and a motorised stage allowing quick and easy specimen positioning. Variable pressure mode enables samples normally unstable in a high vacuum environment, or that have a tendency to charge, to be examined. Pharmaceutical particles, fibres and electronic components may be characterised without coating.
Features of the microscope include:
- magnifications up to 30,000 times
- variable pressure mode for charging, uncoated, and out-gassing samples
- large sample chamber up to 30 centimetres in diameter and 13 centimetres in height
- backscattered electron detector for compositional and topographic imaging
- fully automated stage controls
The microscope has a large area Energy Dispersive X-ray analyser (EDX) attached (Oxford Instruments Ultim Max 170 millimetres²), which allows quantitative or semi-quantitative element analysis of materials present in the sample. It also allows X-ray mapping to show the distribution of particular elements across a sample.
The microscope also has an electron backscatter diffraction detector (EBSD) which can be used to properties in crystalline materials such as crystal structure, grain size and orientation, as well as looking at grain boundaries.
JSM-7900F field emission scanning electron microscope
This field emission scanning electron microscope allows for high-resolution imaging. Features include:
- magnifications up to 500,000 times
- thermal (Schottky) field emission gun (accelerating voltage range 10 volts to 30 kilovolts) with a maximum probe current greater than 500 nA
- imaging at low accelerating voltages of 0.01-5 kilovolts
- resolution of 0.7 nanometres at 1 kilovault and 0.6 nanometres at 15 kilovolts
- samples up to four inches can be inserted into the FE-SEM via the airlock
- in-lens secondary electron and electron detectors allow secondary and backscattered electrons to be detected at very short working distances (up to two millimetres working distance)
- a retractable four quadrant sensitive in-chamber backscatter detector allows backscattered electrons to be detected at 800 volts and higher accelerating voltages
- a Deben four segment STEM detector to allow up to 12 TEM samples to be looked at in the SEM
- two EDX detectors: Ultim Max 170 millimetres² and Ultim Extreme 100 millimetres² at low accelerating voltage for ultimate spatial resolution
- a Quorum PP3010T Cryo system to view beam sensitive samples at low temperatures causing less damage to them